Product introduction
Steam aging test The box is suitable for electronic connectors, plating products, semiconductor ICs, transistors, diodes, liquid crystal LCDs, chip resistors and capacitors, component industries and aging testing for accelerated life before testing the metal pins of electronic components tin dipping Oxidation test for semiconductors, passive components and component pins. Microcomputer temperature controller, LED digital display, PID+SSR control, platinum resistance temperature sensor (PT100), resolution 0.1°C, fully automatic protection.
Technical parameters:
Instrument model: FLR-210 Steam aging test chamber
Inner dimensions: 500×400×170(W×H×D)mm;
Outer dimensions: 600×500×420(W×H×D)mm;
Box material: SUS304# highdignified stainless steel plate;
Insulation layer: PV foam adhesive
Heating time: about 40 minutes;
Control function: PID+ SSR, digital display;
Steam temperature: RT~97℃;
Timer function: 1~9999H/M/S, with time-to-alarm function, power cut when time is up;
Water level control: low water level alarm function;
Instrument power: 1? 220V±10% 50Hz
Instrument weight : 30KG
Structural characteristics
Steam aging The test box has been made made of SUS #304 stainless steel, easy to operate and set
Microcomputer digital LED control, with time scheduling function, can be set up to 9,990 minutes
Multiple overheat protection/water shortage cut-off electric heater and other safety devices .
High temperature and high humidity oxidation test for parts, connectors, passive components and semiconductor pins.
Humidification test met metal pins accelerated aging test.
Using the PID+SSR temperature controller, with time timing function, the maximum can be set to 9990 points unlimited.